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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - A Test Integration Methodology for 3D Integrated Circuits
Chou, Che-Wei, Li, Jin-Fu, Chen, Ji-Jan, Kwai, Ding-Ming, Chou, Yung-Fa, Wu, Cheng-WenYear:
2010
Language:
english
DOI:
10.1109/ATS.2010.71
File:
PDF, 178 KB
english, 2010