[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - Statistical timing yield improvement of dynamic circuits using negative capacitance technique
Mostafa, Hassan, Anis, Mohab, Elmasry, MohamedYear:
2010
Language:
english
DOI:
10.1109/ISCAS.2010.5537560
File:
PDF, 639 KB
english, 2010