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An Electromigration Failure Distribution Model for Short-Length Conductors Incorporating Passive Sinks/Reservoirs
Lin, M. H., Oates, A. S.Volume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2012.2233201
Date:
March, 2013
File:
PDF, 448 KB
english, 2013