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SPIE Proceedings [SPIE International Conference on Sensors and Control Techniques (ICSC2000) - Wuhan, China (Monday 19 June 2000)] International Conference on Sensors and Control Techniques (ICSC 2000) - Aluminum-induced lateral crystallization of amorphous silicon thin films
Rao, Rui, Xu, Zhongyang, Zou, Xuecheng, Sun, Guocai, Jiang, Desheng, Wang, AnboVolume:
4077
Year:
2000
Language:
english
DOI:
10.1117/12.385531
File:
PDF, 204 KB
english, 2000