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Built-in Self Test Power and Test Time Analysis in On-chip Networks
Senejani, Mahdieh Nadi, Ghadiry, Mahdiar, Ooi, Chia Yee, Marsono, Muhammad NadzirVolume:
34
Language:
english
Journal:
Circuits, Systems, and Signal Processing
DOI:
10.1007/s00034-014-9892-4
Date:
April, 2015
File:
PDF, 1.27 MB
english, 2015