Study of nanocrystal memory reliability by CAST structures

Solid-State Electronics 2004 Vol. 48; Iss. 9

Study of nanocrystal memory reliability by CAST structures

Christian Monzio Compagnoni, Daniele Ielmini, Alessandro S Spinelli, Andrea L Lacaita, Cosimo Gerardi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2004.03.014
File:
PDF, 593 KB
english, 2004
Conversion to is in progress
Conversion to is failed