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Post-annealing effects on device performance of AlGaN/GaN HFETs
Jaesun Lee, Dongmin Liu, Hyeongnam Kim, Wu LuVolume:
48
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2004.05.026
File:
PDF, 268 KB
english, 2004