Impurity and defect centers of n-type 4H-SiC single crystals investigated by a photoluminescence and a piezoelectric photo thermal spectroscopies
K. Sakai, A. Fukuyama, S. Shigetomi, T. IkariVolume:
48
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.sse.2004.05.028
File:
PDF, 278 KB
english, 2004