Impurity and defect centers of n-type 4H-SiC single...

Impurity and defect centers of n-type 4H-SiC single crystals investigated by a photoluminescence and a piezoelectric photo thermal spectroscopies

K. Sakai, A. Fukuyama, S. Shigetomi, T. Ikari
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Volume:
48
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.sse.2004.05.028
File:
PDF, 278 KB
english, 2004
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