Modeling C–V characteristics of deep sub-0.1 micron mesoscale MOS devices
Norman G. Gunther, Iliya I. Pesic, Ayhan A. Mutlu, Mahmud RahmanVolume:
48
Year:
2004
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2004.05.030
File:
PDF, 457 KB
english, 2004