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Investigating the effect of WEDM process parameters on 3D micron-scale surface topography related to fractal dimension
Luo, Guofu, Ming, Wuyi, Zhang, Zhen, Liu, Min, Li, He, Li, Yihao, Yin, LingVolume:
75
Language:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-014-6271-z
Date:
December, 2014
File:
PDF, 2.83 MB
english, 2014