![](/img/cover-not-exists.png)
Multiscale image quality measures for defect detection in thin films
Tolba, A. S., Raafat, Hazem M.Volume:
79
Language:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-014-6758-7
Date:
July, 2015
File:
PDF, 922 KB
english, 2015