Scaling CMOS: Finding the gate stack with the lowest...

Solid-State Electronics 2005 Vol. 49; Iss. 5

Scaling CMOS: Finding the gate stack with the lowest leakage current

Thomas Kauerauf, Bogdan Govoreanu, Robin Degraeve, Guido Groeseneken, Herman Maes
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Volume:
49
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2005.01.018
File:
PDF, 328 KB
english, 2005
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