Analysis of variation in leakage currents of Lanthana thin...

Solid-State Electronics 2005 Vol. 49; Iss. 5

Analysis of variation in leakage currents of Lanthana thin films

Yongshik Kim, Shun-ichiro Ohmi, Kazuo Tsutsui, Hiroshi Iwai
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Volume:
49
Year:
2005
Language:
english
Pages:
9
DOI:
10.1016/j.sse.2005.01.022
File:
PDF, 540 KB
english, 2005
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