Fowler–Nordheim high electric field stress of power...

Solid-State Electronics 2005 Vol. 49; Iss. 7

Fowler–Nordheim high electric field stress of power VDMOSFETs

Goran S. Ristić, Momčilo M. Pejović, Aleksandar B. Jakšić
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Volume:
49
Year:
2005
Language:
english
Pages:
13
DOI:
10.1016/j.sse.2005.05.002
File:
PDF, 1.13 MB
english, 2005
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