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A new memory effect (MSD) in fully depleted SOI MOSFETs
M. Bawedin, S. Cristoloveanu, J.G. Yun, D. FlandreVolume:
49
Year:
2005
Language:
english
Pages:
9
DOI:
10.1016/j.sse.2005.07.019
File:
PDF, 784 KB
english, 2005