A new memory effect (MSD) in fully depleted SOI MOSFETs

M. Bawedin, S. Cristoloveanu, J.G. Yun, D. Flandre

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Volume:

Year:

2005

Language:

english

Pages:

DOI:

10.1016/j.sse.2005.07.019

File:

PDF, 784 KB

english, 2005

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