Study of surface-trap-induced gate depletion region of...

Solid-State Electronics 2006 Vol. 50; Iss. 3

Study of surface-trap-induced gate depletion region of field-modulating plate GaAs–FETs

Akio Wakejima, Kazuki Ota, Kohji Matsunaga
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Volume:
50
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2006.01.002
File:
PDF, 320 KB
english, 2006
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