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The low-frequency noise behaviour of graded-channel SOI nMOSFETs
E. Simoen, C. Claeys, T.M. Chung, D. Flandre, M.A. Pavanello, J.A. Martino, J.-P. RaskinVolume:
51
Year:
2007
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2007.01.003
File:
PDF, 271 KB
english, 2007