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Trapping characteristics of lanthanum oxide gate dielectric film explored from temperature dependent current–voltage and capacitance–voltage measurements
Banani Sen, Hei Wong, J. Molina, H. Iwai, J.A. Ng, K. Kakushima, C.K. SarkarVolume:
51
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2007.01.032
File:
PDF, 229 KB
english, 2007