An analytical channel thermal noise model for...

Solid-State Electronics 2007 Vol. 51; Iss. 7

An analytical channel thermal noise model for deep-submicron MOSFETs with short channel effects

Jongwook Jeon, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin
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Volume:
51
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2007.05.004
File:
PDF, 167 KB
english, 2007
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