Physics-based 1/f noise model for MOSFETs with nitrided high-κ gate dielectrics
Tanvir Hasan Morshed, Siva Prasad Devireddy, Zeynep Çelik-Butler, Ajit Shanware, Keith Green, J.J. Chambers, M.R. Visokay, Luigi ColomboVolume:
52
Year:
2008
Language:
english
Pages:
14
DOI:
10.1016/j.sse.2007.10.003
File:
PDF, 462 KB
english, 2008