Evaluation of the ruggedness of power DMOS transistor from electro-thermal simulation of UIS behaviour
Daniel Donoval, Andrej Vrbicky, Juraj Marek, Ales Chvala, Peter BenoVolume:
52
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2007.12.006
File:
PDF, 664 KB
english, 2008