Evaluation of the ruggedness of power DMOS transistor from...

Evaluation of the ruggedness of power DMOS transistor from electro-thermal simulation of UIS behaviour

Daniel Donoval, Andrej Vrbicky, Juraj Marek, Ales Chvala, Peter Beno
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Volume:
52
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2007.12.006
File:
PDF, 664 KB
english, 2008
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