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Degradation of CMOS image sensors in deep-submicron technology due to γ-irradiation
Padmakumar R. Rao, Xinyang Wang, Albert J.P. TheuwissenVolume:
52
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2008.04.023
File:
PDF, 597 KB
english, 2008