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From point defects to dislocation loops: A comprehensive modelling framework for self-interstitial defects in silicon
Ignacio Martin-Bragado, Ibrahim Avci, Nikolas Zographos, Martin Jaraiz, Pedro CastrilloVolume:
52
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2008.04.027
File:
PDF, 296 KB
english, 2008