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Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Akil. K. Sutton, Kurt Moen, John D. Cressler, Martin A. Carts, Paul W. Marshall, Jonathan A. Pellish, Vishwa Ramachandran, Robert A. Reed, Michael L. Alles, Guofu NiuVolume:
52
Year:
2008
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2008.06.038
File:
PDF, 1.56 MB
english, 2008