Imaging of field-effect transistors by focused terahertz...

Solid-State Electronics 2009 Vol. 53; Iss. 6

Imaging of field-effect transistors by focused terahertz radiation

D.B. Veksler, A.V. Muravjov, V.Yu. Kachorovskii, T.A. Elkhatib, K.N. Salama, X.-C. Zhang, M.S. Shur
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Volume:
53
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.sse.2009.04.004
File:
PDF, 317 KB
english, 2009
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