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Mobility extraction in SOI MOSFETs with sub 1 nm body thickness
M. Schmidt, M.C. Lemme, H.D.B. Gottlob, F. Driussi, L. Selmi, H. KurzVolume:
53
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2009.09.017
File:
PDF, 843 KB
english, 2009