DC and low frequency noise characterization of FinFET devices
K. Bennamane, T. Boutchacha, G. Ghibaudo, M. Mouis, N. CollaertVolume:
53
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2009.09.032
File:
PDF, 827 KB
english, 2009