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Investigation of 1/f noise in germanium-on-insulator 0.12 μm PMOS transistors from weak to strong inversion
J. Gyani, M. Valenza, S. Soliveres, F. Martinez, C. Le Royer, E. Augendre, K. Romanjek, C. DrazekVolume:
53
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2009.10.011
File:
PDF, 670 KB
english, 2009