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Application of a novel test system to characterize single-event effects at cryogenic temperatures
Vishwanath Ramachandran, Matthew J. Gadlage, Jonathan R. Ahlbin, Balaji Narasimham, Michael L. Alles, Robert A. Reed, Bharat L. Bhuva, Lloyd W. Massengill, Jeffrey D. Black, Christopher N. FosterVolume:
54
Year:
2010
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2010.05.005
File:
PDF, 1.42 MB
english, 2010