Comprehensive numerical simulation of threshold-voltage transients in nitride memories
Aurelio Mauri, Salvatore M. Amoroso, Christian Monzio Compagnoni, Alessandro Maconi, Alessandro S. SpinelliVolume:
56
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2010.11.004
File:
PDF, 716 KB
english, 2011