Investigation of charge-trap memories with AlN based band engineered storage layers
G. Molas, J.P. Colonna, R. Kies, D. Belhachemi, M. Bocquet, M. Gély, V. Vidal, P. Brianceau, E. Martinez, A.M. Papon, C. Licitra, L. Vandroux, G. Ghibaudo, B. De SalvoVolume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2010.11.030
File:
PDF, 790 KB
english, 2011