LKE and BGI Lorentzian noise in strained and non-strained...

Solid-State Electronics 2011 Vol. 63; Iss. 1

LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric

N. Lukyanchikova, N. Garbar, V. Kudina, A. Smolanka, E. Simoen, C. Claeys
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Volume:
63
Year:
2011
Language:
english
Pages:
10
DOI:
10.1016/j.sse.2011.05.029
File:
PDF, 1.80 MB
english, 2011
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