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Analysis of rare events effect on single-electronics simulation based on orthodox theory
Elabd, Ali A., El-Rabaie, El-Sayed M., Shalaby, Abdelaziz T.Volume:
14
Language:
english
Journal:
Journal of Computational Electronics
DOI:
10.1007/s10825-015-0694-0
Date:
June, 2015
File:
PDF, 1.01 MB
english, 2015