A Shift-Register Based BIST Architecture for FPGA Global...

Journal of Electronic Testing 2015 / 4 Vol. 31; Iss. 2

A Shift-Register Based BIST Architecture for FPGA Global Interconnect Testing and Diagnosis

Pereira, Igor Gadelha, Dias, Leonardo Alves, de Souza, Cleonilson Protásio
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Volume:
31
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-015-5515-7
Date:
April, 2015
File:
PDF, 2.66 MB
english, 2015
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