Effect of annealing at oxygen partial pressure on the conductivity of Ni0.5Mn2.5O4 oxides
Hu, Chia-Jung, Hu, Yi, Nien, C.-Y., Liu, Tung-ChengVolume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-2962-y
Date:
June, 2015
File:
PDF, 855 KB
english, 2015