Surface potential changes of semiconducting oxides monitored by high-pressure photoelectron spectroscopy: Importance of electron concentration at the surface
Y. Gassenbauer, R. Schafranek, A. Klein, S. Zafeiratos, M. Hävecker, A. Knop-Gericke, R. SchlöglVolume:
177
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.ssi.2006.07.036
File:
PDF, 438 KB
english, 2006