Recent calculations and measurements of I–V relations in simple devices based on thin nano versus thick layers of semiconductors with mobile acceptors or donors
Y. Gil, O.M. Umurhan, Y. Tsur, I. RiessVolume:
179
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.ssi.2008.01.001
File:
PDF, 842 KB
english, 2008