Controlled trigger and image restoration for high speed probe card analysis
Shin, Bonghun, Jeon, Soo, Lee, Jiwon, Han, Chung Su, Im, Chang Min, Kwon, Hyock-JuVolume:
16
Language:
english
Journal:
International Journal of Precision Engineering and Manufacturing
DOI:
10.1007/s12541-015-0088-z
Date:
April, 2015
File:
PDF, 1.40 MB
english, 2015