Free-volume defects and microstructure in ion-conducting...

Free-volume defects and microstructure in ion-conducting Ag/AgI-As2S3 glasses as revealed from positron annihilation and microhardness measurements

T. Kavetskyy, J. Borc, P. Petkov, K. Kolev, T. Petkova
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Volume:
183
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.ssi.2010.12.004
File:
PDF, 256 KB
english, 2011
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