Temporal response of silicon EUV and soft X-ray detectors
Artyomov, A. P., Baksht, E. H., Tarasenko, V. F., Fedunin, A. V., Chaikovsky, S. A., Aruev, P. N., Zabrodskii, V. V., Petrenko, M. V., Sobolev, N. A., Suhanov, V. L.Volume:
58
Language:
english
Journal:
Instruments and Experimental Techniques
DOI:
10.1134/S0020441215010017
Date:
January, 2015
File:
PDF, 397 KB
english, 2015