![](/img/cover-not-exists.png)
Ellipsometric in situ diagnostics of the growth of porous anodic oxide films on aluminum
Shvets, V. A., Kruchinin, V. N., Rykhlitskii, S. V., Prokop’ev, V. Yu., Uvarov, N. F.Volume:
118
Language:
english
Journal:
Optics and Spectroscopy
DOI:
10.1134/S0030400X15020162
Date:
February, 2015
File:
PDF, 770 KB
english, 2015