A model predicting sheet charge density and threshold...

Semiconductors 2015 / 4 Vol. 49; Iss. 4

A model predicting sheet charge density and threshold voltage with dependence on interface states density in LM-InAlN/GaN MOSHEMT

Pandey, Devashish, Lenka, T. R.
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Volume:
49
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782615040168
Date:
April, 2015
File:
PDF, 274 KB
english, 2015
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