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β-Radiation-induced decrease of adhesion in AlN/Si structure
Golovin, Yu. I., Dmitrievskiy, A. A., Efremova, N. Yu.Volume:
40
Language:
english
Journal:
Technical Physics Letters
DOI:
10.1134/S1063785014100216
Date:
October, 2014
File:
PDF, 423 KB
english, 2014