The structural state of epitaxial ZnO layers assessed by...

The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction

Kyutt, R. N., Ivanov, S. V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
40
Language:
english
Journal:
Technical Physics Letters
DOI:
10.1134/S106378501410023X
Date:
October, 2014
File:
PDF, 223 KB
english, 2014
Conversion to is in progress
Conversion to is failed