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The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction
Kyutt, R. N., Ivanov, S. V.Volume:
40
Language:
english
Journal:
Technical Physics Letters
DOI:
10.1134/S106378501410023X
Date:
October, 2014
File:
PDF, 223 KB
english, 2014