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Total ionizing dose (TID) effects of γ ray radiation on switching behaviors of Ag/AlOx/Pt RRAM device
Yuan, Fang, Zhang, Zhigang, Wang, Jer-Chyi, Pan, Liyang, Xu, Jun, Lai, Chao-SungVolume:
9
Year:
2014
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/1556-276X-9-452
File:
PDF, 736 KB
english, 2014