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Statistical characteristics of reset switching in Cu/HfO2/Pt resistive switching memory
Zhang, Meiyun, Long, Shibing, Wang, Guoming, Liu, Ruoyu, Xu, Xiaoxin, Li, Yang, Xu, Dinlin, Liu, Qi, Lv, Hangbing, Miranda, Enrique, Suñé, Jordi, Liu, MingVolume:
9
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/1556-276X-9-694
Date:
December, 2014
File:
PDF, 1.49 MB
english, 2014