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Influence of post-annealing on the off current of MoS2 field-effect transistors
Namgung, Seok, Yang, Suk, Park, Kyung, Cho, Ah-Jin, Kim, Hojoong, Kwon, Jang-YeonVolume:
10
Year:
2015
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/s11671-015-0773-y
File:
PDF, 799 KB
english, 2015