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Accuracy of measurement of dynamic surface deformations by the image pattern correlation technique
Boden, F., Kirmse, T., Poroikov, A. Yu., Rinkevichyus, B. S., Skornyakova, N. M., Shashkova, I. A.Volume:
50
Language:
english
Journal:
Optoelectronics, Instrumentation and Data Processing
DOI:
10.3103/S8756699014050057
Date:
September, 2014
File:
PDF, 227 KB
english, 2014