Deposition mechanism and structural characterization of...

Deposition mechanism and structural characterization of TiO2 films produced using ESAVD method

Xianghui Hou, Kwang-Leong Choy
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
180-181
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.surfcoat.2003.10.023
File:
PDF, 618 KB
english, 2004
Conversion to is in progress
Conversion to is failed