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Nanoscale studies of morphological and electrical properties of NixMn3−xO3−δ (0.4≤x≤1) thin films by in-situ high temperature scanning tunneling microscopy and spectroscopy
P.K. Datta, Z. Klusek, A. Basu, A.W. BrinkmanVolume:
187
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.surfcoat.2004.01.042
File:
PDF, 278 KB
english, 2004